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5G Testing at Your Fingertips


Introducing the IEEE 5G/6G Innovation Testbed (Beta), a cloud-based, private, secure, end-to-end 5G network testing platform. The IEEE 5G/6G Innovation Testbed (Beta) provides an efficient, low-cost, collaborative testing and development environment, helping you and your partners get 5G products and services to market faster.

Built by IEEE with the goal of fostering collaborative experimentation, the 5G/6G Innovation Testbed (Beta) encourages operators, equipment vendors, and application developers to work together on a wide range of industry applications in a neutral and trusted environment.

Speed time to market, innovate with confidence and trust, and contribute to the creation of the ‘Network of the Future’ in the IEEE 5G/6G Innovation Testbed (Beta).

Get access to the IEEE 5G/6G Innovation Testbed (Beta) for your organization today. Request a free trial. 







Contact Us

Fill out the form below to contact an IEEE Sales Representative about the IEEE 5G/6G Innovation Testbed.


Features

Features & Benefits:

For a limited time, IEEE is offering faculty, librarians, and information professionals the opportunity to download four FREE eBooks from two engaging eBooks collections available in the IEEE Xplore Digital Library.

We hope you find these eBooks a valuable resource with critical information on emerging topics for your students and researchers. We encourage you to recommend these eBook collections to your librarian or contact your IEEE sales representative today for more information on how to purchase.

Featured Articles, e-Books & Authors

3D Printing Liquid Metal to Create Stretchable Electonic Devices

23 Jan 2019

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As 5G Wireless Rolls Out, Experts Look Ahead to 6G

17 Jan 2019

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Hand-Tracking Tech Is Taking Self-Driving Cars to the Next Level

5 Dec 2019

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Author 1
Frede Blaabjerg

(AALBORG, DENMARK)

Harmonic Stability in Power Electronic Based Power Systems: Concept, Modeling, and Analysis

Author 2
Irith Pomeranz

(INDIANA, US)

Extra Clocking of LFSR Seeds for Improved Path Delay Fault Coverage

Author 3
Manan Suri

(DELHI, INDIA)

Performance Enhancement of Edge-AI-Inference Using Commodity MRAM: IoT Case Study

Terms and Conditions

For a limited time, IEEE is offering faculty, librarians, and information professionals the opportunity to download four FREE eBooks from two engaging eBooks collections available in the IEEE Xplore Digital Library.

We hope you find these eBooks a valuable resource with critical information on emerging topics for your students and researchers. We encourage you to recommend these eBook collections to your librarian or contact your IEEE sales representative today for more information on how to purchase.